by Wende, H., Scherz, A., Sorg, C., Baberschke, K., E. K. U. Gross, Appel, H., Kieron Burke, J. Minár, H. Ebert, A.L. Ankudinov and J.J. Rehr
Reference:
XMCD analysis beyond standard procedures Wende, H., Scherz, A., Sorg, C., Baberschke, K., E. K. U. Gross, Appel, H., Kieron Burke, J. Minár, H. Ebert, A.L. Ankudinov and J.J. Rehr, Chapter in X-ray Absorption Fine Structure - XAFS13 78 (2007).
Bibtex Entry:
@inbook{WSSB07,
Pub-num = {104},
Author = {Wende, H. and Scherz, A. and Sorg, C. and Baberschke, K. and E. K. U. Gross and Appel, H. and Kieron Burke and J. Min{\'a}r and H. Ebert and A.L. Ankudinov and J.J. Rehr},
Booktitle = {X-ray Absorption Fine Structure - XAFS13},
Date-Modified = {2013-02-12 00:16:04 +0000},
Editor = {B. Hedman and P. Pianetta},
Organization = {AIP},
Pages = {78},
Publisher = {AIP},
Title = {XMCD analysis beyond standard procedures},
Year = {2007},
url = {http://scitation.aip.org/content/aip/proceeding/aipcp/10.1063/1.2644435}}